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Hashimoto, Tadashi; Tanida, Kiyoshi; 45 of others*
JPS Conference Proceedings (Internet), 17, p.072001_1 - 072001_4, 2017/07
Hashimoto, Tadashi*; Tanida, Kiyoshi; 49 of others*
IEEE Transactions on Applied Superconductivity, 27(4), p.2100905_1 - 2100905_5, 2017/06
Times Cited Count：12 Percentile：54.35(Engineering, Electrical & Electronic)Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Hirose, Mika*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*
X-Ray Spectrometry, 34(6), p.509 - 513, 2005/11
Times Cited Count：1 Percentile：5.68(Spectroscopy)Surface carbon films on the weathered Japanese roof tiles were characterized by soft X-ray spectroscopy. From the X-ray absorption measurements, it was confirmed that the surface carbon films were oxidized by weathering. On the ohterhand, from the X-ray emission measurements, it can be confirmed that the degree of the orientation was kept in the inner carbon films.
Iihara, Junji*; Muramatsu, Yasuji; Takebe, Toshihiko*; Sawamura, Akitaka*; Namba, Akihiko*; Imai, Takahiro*; Denlinger, J. D.*; Perera, R. C. C.*
Japanese Journal of Applied Physics, Part 1, 44(9A), p.6612 - 6617, 2005/09
Times Cited Count：12 Percentile：43.19(Physics, Applied)Electronic structure transition between semiconducting and metallic states in boron (B) -doped diamonds was element-selectively observed by soft X-ray emission and absorption spectroscopy using synchrotron radiation. For the lightly B-doped diamonds, the B 2
-density of states (DOS) in the valence band were enhanced with a steep-edge-feature near the Fermi level, and localized acceptor levels, characteristic of semiconductors, were clearly observed both in B 2- and C 2-DOS in the conduction bands. For the heavily B-doped diamonds, the localized acceptor levels developed into extended energy levels and new energy levels were generated to form an extended conduction band structure which overlapped with the valence band. Thus, this clarified that the metallic energy band structure is actually formed by heavy boron doping. Such valence and conduction band structures observed by soft X-ray emission and absorption spectroscopy well accounted for the electrical properties of the B-doped diamonds.
NbS
Saito, Yuji; Kobayashi, Keisuke*; Fujimori, Atsushi; Yamamura, Yasuhisa*; Koyano, Mikio*; Tsuji, Toshihide*; Katayama, Shinichi*
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.829 - 832, 2005/06
Times Cited Count：5 Percentile：27.33(Spectroscopy)no abstracts in English
Muramatsu, Yasuji; Tomizawa, Kana; Denlinger, J. D.*; Perera, R. C. C.*
Journal of Electron Spectroscopy and Related Phenomena, 137-140(1-3), p.823 - 826, 2004/07
High-resolution CK X-ray emission spectra of polycyclic aromatic hydrocarbons (PAH) were measured using synchrotron radiation. The main peak energies in the PAH X-ray spectra shifted to a higher energy region as the ratio of hydrogenated outer carbon atoms to the non-hydrogenated inner carbon atoms increased. Discrete variational (DV)-X
molecular orbital calculations provided theoretical confirmation that the spectral features depend on the ratio of hydrogenated/non-hydrogenated carbon atoms, which suggests that the features around the main peaks provide the information of the degree of hydrogenation in PAH compounds.
Terauchi, Masami*; Koike, Masato
Microscopy and Microanalysis, 9(S02), p.894 - 895, 2003/08
We have been developing a high energy-resolution soft-X-ray spectrometer for a transmission electron microscope to obtain the information of the density of states (DOS) of the valence band (occupied states) from identified small specimen areas. We have designed and produced a new grating. The new varied-line-spacing laminar-type holographic grating was designed to have a focal distance of about 50 cm. An energy resolution of about 0.7 eV is expected for X-ray energy of about 1000 eV.
Sasaki, Akira
Purazuma, Kaku Yugo Gakkai-Shi, 79(4), p.315 - 317, 2003/04
no abstracts in English
Ochi, Yoshihiro; Golovkin, I.*; Mancini, R.*; Uschmann, I.*; Sunahara, Atsushi*; Nishimura, Hiroaki*; Fujita, Kazuhisa*; Louis, S.*; Nakai, Mitsuo*; Shiraga, Hiroyuki*; et al.
Review of Scientific Instruments, 74(3), p.1683 - 1687, 2003/03
Times Cited Count：10 Percentile：49.35(Instruments & Instrumentation)no abstracts in English
Muramatsu, Yasuji; Kuramoto, Kentaro*; Gullikson, E. M.*; Perera, R. C. C.*
Surface Review and Letters, 9(1), p.267 - 270, 2002/02
Times Cited Count：5 Percentile：30.57(Chemistry, Physical)no abstracts in English
Auguste, T.*; Faenov, A. Y.*; Fukumoto, Ichiro; Hulin, S.*; Magunov, A. I.*; Monot, P.*; D'Oliveira, P.*; Pikuz, T. A.*; Sasaki, Akira; Sharkov, B. Y.*; et al.
Journal of Quantitative Spectroscopy & Radiative Transfer, 71(2-6), p.147 - 156, 2001/10
Times Cited Count：14 Percentile：57.91(Optics)no abstracts in English
Muramatsu, Yasuji; Watanabe, Masamitsu*; Ueno, Yuko*; Shin, S.*; Perera, R. C. C.*
Journal of Electron Spectroscopy and Related Phenomena, 114-116, p.301 - 305, 2001/03
Times Cited Count：1 Percentile：4.82(Spectroscopy)no abstracts in English
; Yamagata, Ichiro; Donomae, Takako; Akasaka, Naoaki
JNC TN9400 2000-046, 24 Pages, 2000/02
lt is well known that solute atoms are segregated on surface, grain boundary, etc. and composition changed partially in irradiated austenitic stainless steel. For understanding radiation induced segregation (RIS), we adopt a Fe-15Cr-20Ni-x (x: Si, Mo) which is basically alloy system in PNC1520, and size of Si, Mo are different from matrix atoms to investigate RIS behaviors. The specimens were irradiated by "Joyo" fast reactor that irradiation condition is 3.5 
10
n/m
(E>0.1Mev) at 476
C. After irradiation, the specimen were observed and analyzed with EDS (Energy Dispersive X-ray Spectroscope) of 400kV TEM (Transmission Electron Microscope). The behavior of RIS depends on size of solute atoms of alloy. For example, oversized atoms are decreased and undersized atoms are increased in sink. RIS of voids are as same as or more than grain boundaries and smaller than precipitates. The void denuded zone was existed nearby G.B. in case of combinations between the grains from G.B.0ne of the reasons in this, the voids swepted by moving G.B. in radiation induced G.B. migration.
Zhidkov, A. G.*; Sasaki, Akira; Tajima, Toshiki*; T.Auguste*; D'Olivera, P.*; S.Hulin*; P.Monot*; A.Y.Faenov*; T.A.Pikuz*; I.Y.Skoblev*
Physical Review E, 60(3), p.3273 - 3278, 1999/09
Times Cited Count：62 Percentile：88.76(Physics, Fluids & Plasmas)no abstracts in English
Saito, Yuji; Nakatani, Takeshi*; Matsushita, T.*; Miyahara, Tsuneaki*; Fujisawa, M.*; *; *; *; *; *; et al.
Journal of Synchrotron Radiation, 5, p.542 - 544, 1998/00
Times Cited Count：62 Percentile：94.4(Instruments & Instrumentation)no abstracts in English
Kawatsura, Kiyoshi; ; *; *; ; Ozawa, K.; ; *
Nuclear Instruments and Methods in Physics Research A, 262, p.150 - 155, 1987/00
Times Cited Count：8 Percentile：69.76(Instruments & Instrumentation)no abstracts in English
Imazono, Takashi; Koike, Masato; Kuramoto, Satoshi*; Nagano, Tetsuya*; Koeda, Masaru*
no journal, ,
We designed a flat-field soft X-ray spectrometer to detect 
X-rays from 1 to 3.5 keV emitted from the CIS absorber consisting of Cu, In, and Se in a CIS solar cell. We invented a wideband multilayered grating, which was coated with an aperiodic Ni/C multilayer on a laminar-type varied-line-spacing grating, to cover the whole energy range at a constant angle of incidence. Since there is no mechanical movement of the grating and a detector, the spectrometer can provide quick and accurate measurements in the 1-3.5 keV range as well as high resolution analysis.
Takahashi, Hideyuki*; Asahina, Shunsuke*; Murano, Takanori*; Takakura, Yu*; Terauchi, Masami*; Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; et al.
no journal, ,
We developed a soft X-ray emission spectrometer (SXES) with a detection range of 50-210 eV to be able to be installed in commercially available EMPAs and FE-SEMs. This SXES has the spectral resolution of 0.2 eV comparably high with X-ray photo emission spectrometers (XPSs) and electron energy-loss spectrometers (EELSs). In addition, it allows us to perform trace light element analysis with high sensitivity because of high peak-to-background ratio (P/B). Therefore, it is shown that the SXES installed in a FE-SEM can detect trace carbon in steel at the level of 100 ppm and below.
Imazono, Takashi
no journal, ,
A flat-field spectrograph equipped with an aperiodic Ni/C multilayer grating with coverage of the 1-3.5 keV range at a fixed incident angle has been developed. The multilayer coating consists of two kinds of 5.6 nm thick bilayers. One is a conventional Ni/C multilayer having the ratio of Ni thickness to the period of 0.5 and the number of layers of 79. The topmost layer is carbon. The other is a single C/Ni bilayer of Ni thickness ratio of 0.8, which means the deposition order is reversed. Consequently, the C layer just under the topmost Ni layer is a continuous layer of 3.92 nm thickness. The aperiodic multilayer was coated on a laminar grating having a grating constant of 1/2400 mm, groove depth of 2.8 nm, and duty ratio of 0.5. The diffraction efficiency of the multilayer grating varies from 0.8% to 5.4% in 2.1-3.3 keV, and is significantly improved up to 7, 4470 and 102 times higher at 2.1 keV, 2.3 keV and 3.0 keV, respectively, than that of before multilayer deposition.
